Nanounity

This is a video screen capture off a Veeco/DI D3100 with an Invenios XY flexure scanner, scanning a read/write head. The Invenios flexure design enables extremley low out-of-plane motion and higher scan speeds than conventional AFM scanners. The video capture seen here is a 40 micron area from a 200 micron XY scanner, acquired at 5 Hz. Notice that the scan is flat and fast, curvature removal is not necessary with this scanner. These scanners are available for various types of AFM systems. For more details about the AFM scanner upgrade visit www.nanounity.com.

This is a video screen capture off a Veeco/DI D3100 with an Invenios XY flexure scanner, scanning a read/write head. The Invenios flexure design enables extremley low out-of-plane motion and higher scan speeds than conventional AFM scanners. The video capture seen here is a 40 micron area from a 200 micron XY scanner, acquired at 8 Hz. Notice that the scan is flat and fast, curvature removal is not necessary with this scanner. These scanners are available for various types of AFM systems. For more details about the AFM scanner upgrade visit www.nanounity.com.

This is a video sequence taken by scanning ion conductance microscopy (SICM), a relatively new SPM technique now commercially available from ionscope Ltd. One of the significant benefits of SICM is high resolution, nano scale imaging of live cells. The video clip is a sequence of images from an A6 cell, taken over a 24 hour period. During the sequence you can see how the ridge structures are formed on the epithelial cells. Individual microvilli emerge along side one another and gradually merge building up extended ridges. Capturing these dynamic processes at this resolution for an extended time frame would be difficult or impossible with other microscopy techniques. The scan area taken is 40 microns x 40 microns. The scan size is comparable to conventional SPM techniques, but with living cells at higher resolution.